Resolution enhancement of nondestructive testing from B-scans

Hsin M. Shieh, Hsin-Chun Yu, Yu-Ching Hsu, Ruei Yu. Resolution enhancement of nondestructive testing from B-scans. Int. J. Imaging Systems and Technology, 22(3):185-193, 2012. [doi]

Authors

Hsin M. Shieh

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Hsin-Chun Yu

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Yu-Ching Hsu

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Ruei Yu

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