Testability Design for Micro/370, a System/370 Single Chip Microprocessor

F. Warren Shih, Hu H. Chao, Shauchi Ong, Andrew L. Diamond, Jeffrey Y. F. Tang, Cynthia A. Trempel. Testability Design for Micro/370, a System/370 Single Chip Microprocessor. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 412-418, IEEE Computer Society, 1986.

Authors

F. Warren Shih

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Hu H. Chao

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Shauchi Ong

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Andrew L. Diamond

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Jeffrey Y. F. Tang

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Cynthia A. Trempel

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