Learning Discriminative Collections of Part Detectors for Object Recognition

Kevin J. Shih, Ian Endres, Derek Hoiem. Learning Discriminative Collections of Part Detectors for Object Recognition. IEEE Trans. Pattern Anal. Mach. Intell., 37(8):1571-1584, 2015. [doi]

Authors

Kevin J. Shih

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Ian Endres

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Derek Hoiem

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