A Monte Carlo Study of Electron Transport in Silicon nMOSFET Inversion Layers

W.-K. Shih, S. Jallepalli, C.-F. Yeap, Mahbub Rashed, C. M. Maziar, A. F. Tasch Jr.. A Monte Carlo Study of Electron Transport in Silicon nMOSFET Inversion Layers. VLSI Design, 1998(1):53-56, 1998. [doi]

@article{ShihJYRMT98,
  title = {A Monte Carlo Study of Electron Transport in Silicon nMOSFET Inversion Layers},
  author = {W.-K. Shih and S. Jallepalli and C.-F. Yeap and Mahbub Rashed and C. M. Maziar and A. F. Tasch Jr.},
  year = {1998},
  doi = {10.1155/1998/61931},
  url = {https://doi.org/10.1155/1998/61931},
  researchr = {https://researchr.org/publication/ShihJYRMT98},
  cites = {0},
  citedby = {0},
  journal = {VLSI Design},
  volume = {1998},
  number = {1},
  pages = {53-56},
}