Tsuyoshi Shimomura, Hiroshi Yamada. Hardening In-memory Key-value Stores against ECC-uncorrectable Memory Errors. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Baltimore, MD, USA, June 27-30, 2022. pages 509-521, IEEE, 2022. [doi]
@inproceedings{ShimomuraY22,
title = {Hardening In-memory Key-value Stores against ECC-uncorrectable Memory Errors},
author = {Tsuyoshi Shimomura and Hiroshi Yamada},
year = {2022},
doi = {10.1109/DSN53405.2022.00057},
url = {https://doi.org/10.1109/DSN53405.2022.00057},
researchr = {https://researchr.org/publication/ShimomuraY22},
cites = {0},
citedby = {0},
pages = {509-521},
booktitle = {52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Baltimore, MD, USA, June 27-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1693-1},
}