Does calling structure information improve the accuracy of fault prediction?

Yonghee Shin, Robert M. Bell, Thomas J. Ostrand, Elaine J. Weyuker. Does calling structure information improve the accuracy of fault prediction?. In Michael W. Godfrey, Jim Whitehead, editors, Proceedings of the 6th International Working Conference on Mining Software Repositories, MSR 2009 (Co-located with ICSE), Vancouver, BC, Canada, May 16-17, 2009, Proceedings. pages 61-70, IEE, 2009. [doi]

Authors

Yonghee Shin

This author has not been identified. Look up 'Yonghee Shin' in Google

Robert M. Bell

This author has not been identified. Look up 'Robert M. Bell' in Google

Thomas J. Ostrand

This author has not been identified. Look up 'Thomas J. Ostrand' in Google

Elaine J. Weyuker

This author has not been identified. Look up 'Elaine J. Weyuker' in Google