Investigating the reliability of second-order formative measurement in information systems research

Bongsik Shin, Gimun Kim. Investigating the reliability of second-order formative measurement in information systems research. EJIS, 20(5):608-623, 2011. [doi]

@article{ShinK11,
  title = {Investigating the reliability of second-order formative measurement in information systems research},
  author = {Bongsik Shin and Gimun Kim},
  year = {2011},
  doi = {10.1057/ejis.2011.7},
  url = {http://dx.doi.org/10.1057/ejis.2011.7},
  tags = {reliability},
  researchr = {https://researchr.org/publication/ShinK11},
  cites = {0},
  citedby = {0},
  journal = {EJIS},
  volume = {20},
  number = {5},
  pages = {608-623},
}