Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Wooksoo Shin, Hyungu Kahng, Seoung Bum Kim. Mixup-based classification of mixed-type defect patterns in wafer bin maps. Computers & Industrial Engineering, 167:107996, 2022. [doi]