Insup Shin, Jae-Joon Kim, Youngsoo Shin. Aggressive Voltage Scaling Through Fast Correction of Multiple Errors With Seamless Pipeline Operation. IEEE Trans. on Circuits and Systems, 62-I(2):468-477, 2015. [doi]
@article{ShinKS15,
title = {Aggressive Voltage Scaling Through Fast Correction of Multiple Errors With Seamless Pipeline Operation},
author = {Insup Shin and Jae-Joon Kim and Youngsoo Shin},
year = {2015},
doi = {10.1109/TCSI.2014.2364691},
url = {http://dx.doi.org/10.1109/TCSI.2014.2364691},
researchr = {https://researchr.org/publication/ShinKS15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {62-I},
number = {2},
pages = {468-477},
}