Nyeong-Ho Shin, Seon-Ho Lee, Chang-Su Kim 0001. Blind Image Quality Assessment Based on Geometric Order Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024, Seattle, WA, USA, June 16-22, 2024. pages 12799-12808, IEEE, 2024. [doi]
@inproceedings{ShinL024,
title = {Blind Image Quality Assessment Based on Geometric Order Learning},
author = {Nyeong-Ho Shin and Seon-Ho Lee and Chang-Su Kim 0001},
year = {2024},
doi = {10.1109/CVPR52733.2024.01216},
url = {https://doi.org/10.1109/CVPR52733.2024.01216},
researchr = {https://researchr.org/publication/ShinL024},
cites = {0},
citedby = {0},
pages = {12799-12808},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024, Seattle, WA, USA, June 16-22, 2024},
publisher = {IEEE},
isbn = {979-8-3503-5300-6},
}