Hiroyuki Shinbo, Takahide Murakami, Yu Tsukamoto, Yoji Kishi. R&D of technology for high reliability management in advanced 5G network to meet the various requirements of different communication services. In 2021 IEEE VTS 17th Asia Pacific Wireless Communications Symposium (APWCS), Osaka, Japan, August 30-31, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{ShinboMTK21,
title = {R&D of technology for high reliability management in advanced 5G network to meet the various requirements of different communication services},
author = {Hiroyuki Shinbo and Takahide Murakami and Yu Tsukamoto and Yoji Kishi},
year = {2021},
doi = {10.1109/APWCS50173.2021.9548753},
url = {https://doi.org/10.1109/APWCS50173.2021.9548753},
researchr = {https://researchr.org/publication/ShinboMTK21},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2021 IEEE VTS 17th Asia Pacific Wireless Communications Symposium (APWCS), Osaka, Japan, August 30-31, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0120-3},
}