Cyclic greedy generation method for limited number of IDDQ tests

Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi. Cyclic greedy generation method for limited number of IDDQ tests. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 362, IEEE Computer Society, 2000. [doi]

Authors

Tsuyoshi Shinogi

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Masahiro Ushio

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Terumine Hayashi

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