Mitsuru Shiozaki, Takeshi Sugawara 0001, Takeshi Fujino. Exploring Effect of Residual Electric Charges on Cryptographic Circuits: Extended Version. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 106(3):281-293, March 2023. [doi]
@article{ShiozakiSF23,
title = {Exploring Effect of Residual Electric Charges on Cryptographic Circuits: Extended Version},
author = {Mitsuru Shiozaki and Takeshi Sugawara 0001 and Takeshi Fujino},
year = {2023},
month = {March},
doi = {10.1587/transfun.2022cip0009},
url = {https://doi.org/10.1587/transfun.2022cip0009},
researchr = {https://researchr.org/publication/ShiozakiSF23},
cites = {0},
citedby = {0},
journal = {IEICE Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {106},
number = {3},
pages = {281-293},
}