The role of electronic energy loss in SHI irradiated Ni/oxide/n-GaP Schottky diode

N. Shiwakoti, A. Bobby, K. Asokan, Bobby Antony. The role of electronic energy loss in SHI irradiated Ni/oxide/n-GaP Schottky diode. Microelectronics Reliability, 69:40-46, 2017. [doi]

Authors

N. Shiwakoti

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A. Bobby

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K. Asokan

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Bobby Antony

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