Key characteristics-based sensor distribution in multi-station assembly processes

Nagesh Shukla, Dariusz Ceglarek, Manoj Kumar Tiwari. Key characteristics-based sensor distribution in multi-station assembly processes. J. Intelligent Manufacturing, 26(1):43-58, 2015. [doi]

Authors

Nagesh Shukla

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Dariusz Ceglarek

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Manoj Kumar Tiwari

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