Power Quality Event Classification Under Noisy Conditions Using EMD-Based De-Noising Techniques

Stuti Shukla, S. Mishra, Bhim Singh. Power Quality Event Classification Under Noisy Conditions Using EMD-Based De-Noising Techniques. IEEE Trans. Industrial Informatics, 10(2):1044-1054, 2014. [doi]

@article{ShuklaMS14,
  title = {Power Quality Event Classification Under Noisy Conditions Using EMD-Based De-Noising Techniques},
  author = {Stuti Shukla and S. Mishra and Bhim Singh},
  year = {2014},
  doi = {10.1109/TII.2013.2289392},
  url = {http://dx.doi.org/10.1109/TII.2013.2289392},
  researchr = {https://researchr.org/publication/ShuklaMS14},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {10},
  number = {2},
  pages = {1044-1054},
}