Xiaosheng Si, Tianmei Li, Qi Zhang. A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements. IEEE Transactions on Reliability, 68(3):1080-1100, 2019. [doi]
@article{SiLZ19,
title = {A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements},
author = {Xiaosheng Si and Tianmei Li and Qi Zhang},
year = {2019},
doi = {10.1109/TR.2019.2908492},
url = {https://doi.org/10.1109/TR.2019.2908492},
researchr = {https://researchr.org/publication/SiLZ19},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {68},
number = {3},
pages = {1080-1100},
}