Etienne Sicard, J. M. Dienot. Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility. Microelectronics Reliability, 45(9-11):1277-1284, 2005. [doi]
@article{SicardD05,
title = {Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility},
author = {Etienne Sicard and J. M. Dienot},
year = {2005},
doi = {10.1016/j.microrel.2005.07.057},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.057},
researchr = {https://researchr.org/publication/SicardD05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {9-11},
pages = {1277-1284},
}