Khawja Sikander, Suoyue Zhan, Chunhong Chen. An Analytical Model for Circuit Reliability Estimation. In 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021. pages 84-87, IEEE, 2021. [doi]
@inproceedings{SikanderZC21,
title = {An Analytical Model for Circuit Reliability Estimation},
author = {Khawja Sikander and Suoyue Zhan and Chunhong Chen},
year = {2021},
doi = {10.1109/MWSCAS47672.2021.9531822},
url = {https://doi.org/10.1109/MWSCAS47672.2021.9531822},
researchr = {https://researchr.org/publication/SikanderZC21},
cites = {0},
citedby = {0},
pages = {84-87},
booktitle = {64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021},
publisher = {IEEE},
isbn = {978-1-6654-2461-5},
}