Challenges for high-density 16Gb ReRAM with 27nm technology - researchr publication authors

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Scott Sills, Shuichiro Yasuda, Alessandro Calderoni, Christopher Cardon, Jonathan Strand, Katsuhisa Aratani, Nirmal Ramaswamy. Challenges for high-density 16Gb ReRAM with 27nm technology. In Symposium on VLSI Circuits, VLSIC 2015, Kyoto, Japan, June 17-19, 2015. pages 106, IEEE, 2015. [doi]

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