PVT variability analysis of FinFET and CMOS XOR circuits at 16nm - researchr publication authors

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Fabio G. R. G. da Silva, Paulo F. Butzen, Cristina Meinhardt. PVT variability analysis of FinFET and CMOS XOR circuits at 16nm. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 528-531, IEEE, 2016. [doi]

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