Kok-Swee Sim, Chih Ping Tso, Yik Yee Tan, Shyamala Pillay. Line Profile Measurement for SEM Imaging System. In Hamid R. Arabnia, editor, Proceedings of the 2006 International Conference on Image Processing, Computer Vision, & Pattern Recognition, Las Vegas, Nevada, USA, June 26-29, 2006, Volume 1. pages 88-94, CSREA Press, 2006.
@inproceedings{SimTTP06,
title = {Line Profile Measurement for SEM Imaging System},
author = {Kok-Swee Sim and Chih Ping Tso and Yik Yee Tan and Shyamala Pillay},
year = {2006},
researchr = {https://researchr.org/publication/SimTTP06},
cites = {0},
citedby = {0},
pages = {88-94},
booktitle = {Proceedings of the 2006 International Conference on Image Processing, Computer Vision, & Pattern Recognition, Las Vegas, Nevada, USA, June 26-29, 2006, Volume 1},
editor = {Hamid R. Arabnia},
publisher = {CSREA Press},
isbn = {1-932415-93-9},
}