Cross-sample prototype matching and multiscale spatial correlation consistency for defect segmentation under limited annotations

Dejene M. Sime, Nan Ouyang, Kai Sheng, Adnan A. Qaseem, Yiting Liu, Xiaojiang Ren. Cross-sample prototype matching and multiscale spatial correlation consistency for defect segmentation under limited annotations. Expert Syst. Appl., 331:133304, 2026. [doi]

Authors

Dejene M. Sime

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Nan Ouyang

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Kai Sheng

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Adnan A. Qaseem

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Yiting Liu

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Xiaojiang Ren

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