Masayuti Simongyi, Prabhas Chongstitvatana. Machine Learning Methods for Abnormality Detection in Hard Disk Drive Assembly Process: Bi-LSTM, Wavelet-CNN and SVM. In 2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018. pages 392-399, IEEE, 2018. [doi]
@inproceedings{SimongyiC18,
title = {Machine Learning Methods for Abnormality Detection in Hard Disk Drive Assembly Process: Bi-LSTM, Wavelet-CNN and SVM},
author = {Masayuti Simongyi and Prabhas Chongstitvatana},
year = {2018},
doi = {10.1109/EECS.2018.00079},
url = {https://doi.org/10.1109/EECS.2018.00079},
researchr = {https://researchr.org/publication/SimongyiC18},
cites = {0},
citedby = {0},
pages = {392-399},
booktitle = {2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018},
publisher = {IEEE},
isbn = {978-1-7281-1929-8},
}