An efficient algorithm for discovering positive and negative patterns

Raj Singh, Tom Johnsten, Vijay Raghavan, Ying Xie. An efficient algorithm for discovering positive and negative patterns. In The 2009 IEEE International Conference on Granular Computing, GrC 2009, Lushan Mountain, Nanchang, China, 17-19 August 2009. pages 507-512, IEEE, 2009. [doi]

Authors

Raj Singh

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Tom Johnsten

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Vijay Raghavan

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Ying Xie

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