A novel dice similarity measure for IFSs and its applications in pattern and face recognition

Akanksha Singh, Sanjay Kumar. A novel dice similarity measure for IFSs and its applications in pattern and face recognition. Expert Syst. Appl., 149:113245, 2020. [doi]

@article{SinghK20-4,
  title = {A novel dice similarity measure for IFSs and its applications in pattern and face recognition},
  author = {Akanksha Singh and Sanjay Kumar},
  year = {2020},
  doi = {10.1016/j.eswa.2020.113245},
  url = {https://doi.org/10.1016/j.eswa.2020.113245},
  researchr = {https://researchr.org/publication/SinghK20-4},
  cites = {0},
  citedby = {0},
  journal = {Expert Syst. Appl.},
  volume = {149},
  pages = {113245},
}