Shanker Singh, Vijendra Pal Singh. A probabilistic approach for testing large-scale integrated circuits. International Journal of Parallel Programming, 7(3):283-294, 1978. [doi]
@article{SinghS78,
title = {A probabilistic approach for testing large-scale integrated circuits},
author = {Shanker Singh and Vijendra Pal Singh},
year = {1978},
doi = {10.1007/BF00991634},
url = {http://dx.doi.org/10.1007/BF00991634},
researchr = {https://researchr.org/publication/SinghS78},
cites = {0},
citedby = {0},
journal = {International Journal of Parallel Programming},
volume = {7},
number = {3},
pages = {283-294},
}