Koustav Sinha, Joe Varghese, Abhijit Dasgupta. Effect of geometric complexities and nonlinear material properties on interfacial crack behavior in electronic devices. Microelectronics Reliability, 54(3):610-618, 2014. [doi]
@article{SinhaVD14,
title = {Effect of geometric complexities and nonlinear material properties on interfacial crack behavior in electronic devices},
author = {Koustav Sinha and Joe Varghese and Abhijit Dasgupta},
year = {2014},
doi = {10.1016/j.microrel.2013.11.014},
url = {http://dx.doi.org/10.1016/j.microrel.2013.11.014},
researchr = {https://researchr.org/publication/SinhaVD14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {3},
pages = {610-618},
}