Appa Iyer Sivakumar. Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system. In Winter Simulation Conference. pages 727-735, 1999. [doi]
@inproceedings{Sivakumar99,
title = {Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system},
author = {Appa Iyer Sivakumar},
year = {1999},
url = {http://portal.acm.org/citation.cfm?id=324138.324467},
tags = {optimization, rule-based, testing},
researchr = {https://researchr.org/publication/Sivakumar99},
cites = {0},
citedby = {0},
pages = {727-735},
booktitle = {Winter Simulation Conference},
}