Margin-based approach for outlier detection of industrial design data using a modified general regression neural network

Jayaram Sivaramakrishnan, Gareth Lee, David Parlevliet, Kok Wai Wong. Margin-based approach for outlier detection of industrial design data using a modified general regression neural network. AI EDAM, 36, 2022. [doi]

Authors

Jayaram Sivaramakrishnan

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Gareth Lee

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David Parlevliet

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Kok Wai Wong

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