Kaarthik Sivashanmugam, Da Lin, Senthil Palanisamy. Scenario Driven Testing. In Eighth International Conference on Information Technology: New Generations, ITNG 2011, Las Vegas, Nevada, USA, 11-13 April 2011. pages 299-303, IEEE Computer Society, 2011. [doi]
@inproceedings{SivashanmugamLP11,
title = {Scenario Driven Testing},
author = {Kaarthik Sivashanmugam and Da Lin and Senthil Palanisamy},
year = {2011},
doi = {10.1109/ITNG.2011.59},
url = {http://dx.doi.org/10.1109/ITNG.2011.59},
tags = {testing},
researchr = {https://researchr.org/publication/SivashanmugamLP11},
cites = {0},
citedby = {0},
pages = {299-303},
booktitle = {Eighth International Conference on Information Technology: New Generations, ITNG 2011, Las Vegas, Nevada, USA, 11-13 April 2011},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4367-3},
}