Improving reliability of thick film initiators for automotive applications based on FE-analyses

Walter Smetana, Roland Reicher, H. Homolka. Improving reliability of thick film initiators for automotive applications based on FE-analyses. Microelectronics Reliability, 45(7-8):1194-1201, 2005. [doi]

Authors

Walter Smetana

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Roland Reicher

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H. Homolka

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