Alexander Smirnov, Evgeniya Smirnova, Sergey Alexandrov. A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data. Symmetry, 12(4):677, 2020. [doi]
@article{SmirnovSA20,
title = {A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data},
author = {Alexander Smirnov and Evgeniya Smirnova and Sergey Alexandrov},
year = {2020},
doi = {10.3390/sym12040677},
url = {https://doi.org/10.3390/sym12040677},
researchr = {https://researchr.org/publication/SmirnovSA20},
cites = {0},
citedby = {0},
journal = {Symmetry},
volume = {12},
number = {4},
pages = {677},
}