Kenneth Scot Smith, Li Ran. Torsional Resonance Risk Management in Islanded Industrial Power Systems Supplying Large VFDs. In Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, New Orleans, LA, USA, September 23-27, 2007. pages 2429-2438, IEEE, 2007. [doi]
@inproceedings{SmithR07,
title = {Torsional Resonance Risk Management in Islanded Industrial Power Systems Supplying Large VFDs},
author = {Kenneth Scot Smith and Li Ran},
year = {2007},
doi = {10.1109/07IAS.2007.366},
url = {https://doi.org/10.1109/07IAS.2007.366},
researchr = {https://researchr.org/publication/SmithR07},
cites = {0},
citedby = {0},
pages = {2429-2438},
booktitle = {Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, New Orleans, LA, USA, September 23-27, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1260-0},
}