A Visual Trace Analysis Tool for Understanding Feature Scattering - researchr publication authors

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Victor Sobreira, Marcelo de Almeida Maia. A Visual Trace Analysis Tool for Understanding Feature Scattering. In WCRE 2008, Proceedings of the 15th Working Conference on Reverse Engineering, Antwerp, Belgium, October 15-18, 2008. pages 337-338, IEEE, 2008. [doi]

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