So Young Sohn, Hong Sik Kim. Random effects logistic regression model for default prediction of technology credit guarantee fund. European Journal of Operational Research, 183(1):472-478, 2007. [doi]
@article{SohnK07:0,
title = {Random effects logistic regression model for default prediction of technology credit guarantee fund},
author = {So Young Sohn and Hong Sik Kim},
year = {2007},
doi = {10.1016/j.ejor.2006.10.006},
url = {http://dx.doi.org/10.1016/j.ejor.2006.10.006},
researchr = {https://researchr.org/publication/SohnK07%3A0},
cites = {0},
citedby = {0},
journal = {European Journal of Operational Research},
volume = {183},
number = {1},
pages = {472-478},
}