Degradation of pMOSFETs due to hot electron induced punchthrough

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang. Degradation of pMOSFETs due to hot electron induced punchthrough. Microelectronics Reliability, 59:13-17, 2016. [doi]

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