NamRye Son, Gueesang Lee. Error Concealment Using Discontinuity Features. In Francisco J. Perales López, Aurélio C. Campilho, Nicolas Pérez de la Blanca, Alberto Sanfeliu, editors, Pattern Recognition and Image Analysis, First Iberian Conference, IbPRIA 2003, Puerto de Andratx, Mallorca, Spain, June 4-6, 2003, Proceedings. Volume 2652 of Lecture Notes in Computer Science, pages 994-1002, Springer, 2003. [doi]
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