Ruiqiang Song, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen. Modeling the impact of process and operation variations on the soft error rate of digital circuits. Science in China Series F: Information Sciences, 60(12):129402, 2017. [doi]
@article{SongCLCC17,
title = {Modeling the impact of process and operation variations on the soft error rate of digital circuits},
author = {Ruiqiang Song and Shuming Chen and Bin Liang and Yaqing Chi and Jianjun Chen},
year = {2017},
doi = {10.1007/s11432-016-9001-9},
url = {https://doi.org/10.1007/s11432-016-9001-9},
researchr = {https://researchr.org/publication/SongCLCC17},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {60},
number = {12},
pages = {129402},
}