Deep Metric Learning via Facility Location - researchr publication authors

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Hyun Oh Song, Stefanie Jegelka, Vivek Rathod, Kevin Murphy 0002. Deep Metric Learning via Facility Location. In 2017 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017, Honolulu, HI, USA, July 21-26, 2017. pages 2206-2214, IEEE Computer Society, 2017. [doi]

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