Test Data Generation Techniques for Mutation Testing: A Systematic Mapping

Francisco Carlos M. Souza, Mike Papadakis, Vinicius H. S. Durelli, Márcio Eduardo Delamaro. Test Data Generation Techniques for Mutation Testing: A Systematic Mapping. In Jaelson Castro, Claudia P. Ayala, Giovanni Giachetti, Márcia Lucena, Carlos Cares, Xavier Franch, Monalessa Perini Barcellos, Maria Lencastre, Beatriz Marín, Ricardo Gacitua, editors, Proceedings of the XVII Iberoamerican Conference on Software Engineering, CIbSE 2014, Pucon, Chile, April 23-25, 2014. pages 419-432, Curran Associates, 2014.

@inproceedings{SouzaPDD14,
  title = {Test Data Generation Techniques for Mutation Testing: A Systematic Mapping},
  author = {Francisco Carlos M. Souza and Mike Papadakis and Vinicius H. S. Durelli and Márcio Eduardo Delamaro},
  year = {2014},
  researchr = {https://researchr.org/publication/SouzaPDD14},
  cites = {0},
  citedby = {0},
  pages = {419-432},
  booktitle = {Proceedings of the XVII Iberoamerican Conference on Software Engineering, CIbSE 2014, Pucon, Chile, April 23-25, 2014},
  editor = {Jaelson Castro and Claudia P. Ayala and Giovanni Giachetti and Márcia Lucena and Carlos Cares and Xavier Franch and Monalessa Perini Barcellos and Maria Lencastre and Beatriz Marín and Ricardo Gacitua},
  publisher = {Curran Associates},
  isbn = {978-1-63266-649-9},
}