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Investigating measurement methods for high-resolution electromagnetic field side-channel analysis

Robert Specht, Johann Heyszl, Georg Sigl. Investigating measurement methods for high-resolution electromagnetic field side-channel analysis. In 2014 International Symposium on Integrated Circuits (ISIC), Singapore, December 10-12, 2014. pages 21-24, IEEE, 2014. [doi]

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Robert Specht

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Johann Heyszl

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Georg Sigl

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