Jaime Spencer, C. Stella Qian, Michaela Trescakova, Chris Russell 0001, Simon Hadfield, Erich W. Graf, Wendy J. Adams, Andrew J. Schofield, James H. Elder, Richard Bowden, Ali Anwar 0002, Hao Chen, Xiaozhi Chen, Kai Cheng, Yuchao Dai, Huynh Thai Hoa, Sadat Hossain, Jianmian Huang, Mohan Jing, Bo Li, Chao Li, Baojun Li, Zhiwen Liu, Stefano Mattoccia, Siegfried Mercelis, MyungWoo Nam, Matteo Poggi, Xiaohua Qi, Jiahui Ren, Yang Tang, Fabio Tosi, Linh Trinh, S. M. Nadim Uddin, Khan Muhammad Umair, Kaixuan Wang, Yufei Wang, Yixing Wang, Mochu Xiang, Guangkai Xu, Wei Yin, Jun Yu, Qi Zhang, Chaoqiang Zhao. The Second Monocular Depth Estimation Challenge. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 3064-3076, IEEE, 2023. [doi]
@inproceedings{SpencerQTRHGASEBACCCDHHHJLLLLMMNPQRTTT23,
title = {The Second Monocular Depth Estimation Challenge},
author = {Jaime Spencer and C. Stella Qian and Michaela Trescakova and Chris Russell 0001 and Simon Hadfield and Erich W. Graf and Wendy J. Adams and Andrew J. Schofield and James H. Elder and Richard Bowden and Ali Anwar 0002 and Hao Chen and Xiaozhi Chen and Kai Cheng and Yuchao Dai and Huynh Thai Hoa and Sadat Hossain and Jianmian Huang and Mohan Jing and Bo Li and Chao Li and Baojun Li and Zhiwen Liu and Stefano Mattoccia and Siegfried Mercelis and MyungWoo Nam and Matteo Poggi and Xiaohua Qi and Jiahui Ren and Yang Tang and Fabio Tosi and Linh Trinh and S. M. Nadim Uddin and Khan Muhammad Umair and Kaixuan Wang and Yufei Wang and Yixing Wang and Mochu Xiang and Guangkai Xu and Wei Yin and Jun Yu and Qi Zhang and Chaoqiang Zhao},
year = {2023},
doi = {10.1109/CVPRW59228.2023.00308},
url = {https://doi.org/10.1109/CVPRW59228.2023.00308},
researchr = {https://researchr.org/publication/SpencerQTRHGASEBACCCDHHHJLLLLMMNPQRTTT23},
cites = {0},
citedby = {0},
pages = {3064-3076},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0249-3},
}