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Temporal Characteristics of Top-Down Modulations during Working Memory Maintenance: An Event-related Potential Study of the N170 Component

Kartik K. Sreenivasan, Jennifer Katz, Amishi P. Jha. Temporal Characteristics of Top-Down Modulations during Working Memory Maintenance: An Event-related Potential Study of the N170 Component. J. Cognitive Neuroscience, 19(11):1836-1844, 2007. [doi]

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