Viranjay M. Srivastava, Kalyan S. Yadav, Ghanashyam Singh. Measurement Process of MOSFET Device Parameters with VEE Pro Software for DP4T RF Switch. IJCNS, 4(9):590-600, 2011. [doi]
@article{SrivastavaYS11-1, title = {Measurement Process of MOSFET Device Parameters with VEE Pro Software for DP4T RF Switch}, author = {Viranjay M. Srivastava and Kalyan S. Yadav and Ghanashyam Singh}, year = {2011}, doi = {10.4236/ijcns.2011.49071}, url = {http://dx.doi.org/10.4236/ijcns.2011.49071}, researchr = {https://researchr.org/publication/SrivastavaYS11-1}, cites = {0}, citedby = {0}, journal = {IJCNS}, volume = {4}, number = {9}, pages = {590-600}, }