A 90nm CMOS cryptographic core with improved fault-tolerance in presence of massive defect density - researchr publication authors

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Milos Stanisavljevic, Frank Kagan Gürkaynak, Alexandre Schmid, Yusuf Leblebici, Maria Gabrani. A 90nm CMOS cryptographic core with improved fault-tolerance in presence of massive defect density. In Salvatore Coffa, editor, 2nd Internationa ICST Conference on Nano-Networks, Nano-Net 2007, Catania, Italy, September 24-26, 2007. pages 4, ICST/ACM, 2007. [doi]

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