Luigi di Stefano, Frank Boland. Three-dimensional inspection of printed circuit boards using phase profilometry. In 8th European Signal Processing Conference, EUSIPCO 1996, Trieste, Italy, 10-13 September, 1996. pages 1-4, IEEE, 1996. [doi]
@inproceedings{StefanoB96,
title = {Three-dimensional inspection of printed circuit boards using phase profilometry},
author = {Luigi di Stefano and Frank Boland},
year = {1996},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7083019},
researchr = {https://researchr.org/publication/StefanoB96},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {8th European Signal Processing Conference, EUSIPCO 1996, Trieste, Italy, 10-13 September, 1996},
publisher = {IEEE},
isbn = {978-888-6179-83-6},
}