Andrew Stein, Michael Werman. Robust statistics in shape fitting. In IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992, Proceedings, 15-18 June, 1992, Champaign, Illinois, USA. pages 540-546, IEEE, 1992. [doi]
@inproceedings{SteinW92-0,
title = {Robust statistics in shape fitting},
author = {Andrew Stein and Michael Werman},
year = {1992},
doi = {10.1109/CVPR.1992.223138},
url = {http://dx.doi.org/10.1109/CVPR.1992.223138},
researchr = {https://researchr.org/publication/SteinW92-0},
cites = {0},
citedby = {0},
pages = {540-546},
booktitle = {IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 1992, Proceedings, 15-18 June, 1992, Champaign, Illinois, USA},
publisher = {IEEE},
}