Faster Attend-Infer-Repeat with Tractable Probabilistic Models - researchr publication authors

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Karl Stelzner, Robert Peharz, Kristian Kersting. Faster Attend-Infer-Repeat with Tractable Probabilistic Models. In Kamalika Chaudhuri, Ruslan Salakhutdinov, editors, Proceedings of the 36th International Conference on Machine Learning, ICML 2019, 9-15 June 2019, Long Beach, California, USA. Volume 97 of Proceedings of Machine Learning Research, pages 5966-5975, PMLR, 2019. [doi]

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