Luca Sterpone, B. Du, S. Azimi. Radiation-induced single event transients modeling and testing on nanometric flash-based technologies. Microelectronics Reliability, 55(9-10):2087-2091, 2015. [doi]
@article{SterponeDA15,
title = {Radiation-induced single event transients modeling and testing on nanometric flash-based technologies},
author = {Luca Sterpone and B. Du and S. Azimi},
year = {2015},
doi = {10.1016/j.microrel.2015.07.035},
url = {http://dx.doi.org/10.1016/j.microrel.2015.07.035},
researchr = {https://researchr.org/publication/SterponeDA15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {2087-2091},
}